Granados X., Puig T., Obradors X., Vlad R., Pop C., Deutscher G., Barusco P., Gupta K., Queralto A., Almog B., Saraf A.
Ключевые слова: HTS, YBCO, thin films, microwave devices, impedance, measurement technique, substrate sapphire, meander
Ключевые слова: power equipment, FCL resistive, HTS, YBCO, double-side structures, thin films, quench propagation, recovery characteristics, substrate sapphire, meander, series connection, fault currents, ac performance, critical caracteristics, critical current density, distribution, resistance, overcurrent, temperature distribution, test results
Lee S., Li F., Wang T., Kang Y., Jiang C., Kuhn S.J., Dadisman R., Wasilko D., Kaiser H., Buck Z.*, Schaeperkoetter J., Crow L., Riedel R., Robertson L., Silva N., Hong K.
Ключевые слова: HTS, YBCO, coated conductors, coils, films, substrate sapphire, neutron scattering, design parameters, operational performance, resonance effects
Mancini A., Rufoloni A., Vannozzi A., Braccini V., Putti M., Manfrinetti P., Rizzo F., Augieri A., Silva E., Armenio A.A., Pinto V., Piperno L., Sylva G., Masi A., Prili S., Celentano E.S.
Ключевые слова: chalcogenide, FeSeTe, films, PLD process, fabrication, buffer layers, films epitaxial, chemical solution deposition, substrate single crystal, substrate sapphire, substrate SrTiO3, X-ray diffraction, microstructure, resistive transition, resistance, temperature dependence, critical caracteristics, Jc/B curves, pinning force
Ключевые слова: MgB2, thin films, irradiation effects, ion irradiation, carbon, critical caracteristics, HPCVD process, substrate sapphire, X-ray diffraction, lattice parameter, resistive transition, RRR parameter, critical temperature, Jc/B curves, irreversibility fields, pinning force, fabrication, experimental results
Ключевые слова: HTS, YGdBCO, films, substrate sapphire, buffer layers, annealing process, TFA-MOD process, critical caracteristics, critical temperature, upper critical fields, irreversibility fields, temperature dependence, Jc/B curves, critical current density, angular dependence, self-field effect, experimental results
Ключевые слова: HTS, YBCO, thin films, substrate sapphire, power equipment, switches, control systems, ac magnetic field dependence, flux pumps, converters, switching process, YBCO, coated conductors, dynamic resistance, substrate Hastelloy, buffer layers, stabilizing layers, resistance, prototype, fabrication, test results
Tixador P., Martini L., Gomory F., Bauer M., Noe M., Bruzek C., Calleja A., Deutscher G., Bertrand D, Obradors X.*10, Pekarcikova M.*11, Sirois F.*12
Ключевые слова: presentation, HTS, thick films, substrate sapphire, flux pumps, switches, ac performance, YBCO, coated conductors
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